Turret type testing and sorting machine, used for testing, marking, sorting and taping of extremely small semiconductor devices.

Inverted DDR servo motor, vertically set rotating shaft, aluminum alloy rotating table mounted on the rotating shaft, frame and other components, feeding mechanism, unloading and braiding mechanism, computer that controls the actions of other components, etc. . In addition, a plurality of flexible manipulators that can be raised and lowered are evenly distributed on the circumference of the rotating table. A plurality of working positions are installed on the large frame of the frame under the rotating table, and the upper part of each working position is provided with a cavity. The working position has a loading position, multiple test positions, rotating positioning, waste detection and classification, marking position, expandable position and unloading position.

The processing speed is fast, the detection and sorting efficiency is high, and the damage to the semiconductor device is small, and it can be used for the test and sorting of extremely small semiconductor devices on a large scale.