Shenzhen shenkeda Semiconductor Technology Co., Ltd.

Group Stock Code:688328

Service hotline:

+86 0752-5880-900(8280)
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Location:  Home  -> Products  ->  Translation series  ->  SKD308T
2025
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The SKD308T tri-temperature pick and place test handler is suitable for DFN, QFN, LQFP, LGA, BGA, CSP, SOP, MSOP and other product specifications in 2X2-110X110 low temperature/normal temperature/high temperature test and classification requirements. To bring high quality product output to customers.

● Taking and discharging mechanical arm: Y-axis is double-sided drive mode; Z-axis motor independent control, equipped with 2X4 taking and discharging nozzle, X Pitch variable. The nozzle module adopts the span beam design, the center of gravity is stable, not easy to deform.

● Pressure measuring module: equipped with precision floating head and socket stack sensor, automatic calculation of pressure measurement, up to support 120 kgf.

● Shuttle module: XY two directions are equipped with sensors, accurately detect whether the shuttle car is stacked or not flat, protect materials; The unloading shuttle car has the function of return temperature heating.

● Temperature control system: Test TJ: ±2℃; Preheating tray/Shuttle: ±3℃; TC: ±1℃; 200W@ -55℃/300W@ -40℃/850W @ 25℃/1150W@ 85~150℃ / 200℃(Optional).

● Plate module: feed plate is equipped with motor screw, it is more convenient to adjust when using different thickness plate./span>

● Automatic cleaning function: configure the cleaning plate assembly, the device automatically cleans the probe after the number of tests reaches the set value.

● Changing tray pickup arms: clamping claw mode, stable and reliable, with power failure automatic pull-up function.

● Front and rear configuration display touch screen and key panel, support to connect a variety of brand testing machines.


   Contact Information​:+86 13537507730

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